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The 13th Asia and South Pacific Design Automation Conference

Session 7A  Reliable/Testable Design Techniques
Time: 10:15 - 12:20 Thursday, January 24, 2008
Location: Room 310A
Chairs: Huawei Li (Chinese Academy of Sciences, China), Sungho Kang (Yonsei Univ., Republic of Korea)

7A-1 (Time: 10:15 - 10:40)
TitleSoft Error Rate Reduction Using Redundancy Addition and Removal
Author*Kai-Chiang Wu, Diana Marculescu (Carnegie Mellon Univ., United States)
Pagepp. 559 - 564
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7A-2 (Time: 10:40 - 11:05)
TitleLocalized Random Access Scan: Towards Low Area and Routing Overhead
Author*Yu Hu, Xiang Fu, Xiaoxin Fan (Chinese Academy of Sciences, China), Hideo Fujiwara (NAIST, Japan)
Pagepp. 565 - 570
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7A-3 (Time: 11:05 - 11:30)
TitleA Design-for-Diagnosis Technique for Diagnosing Both Scan Chain Faults and Combinational Circuit Faults
AuthorFei Wang, *Yu Hu, Huawei Li, Xiaowei Li (Chinese Academy of Sciences, China)
Pagepp. 571 - 576
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7A-4 (Time: 11:30 - 11:55)
TitleGECOM: Test Data Compression Combined with All Unknown Response Masking
Author*Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki (Waseda Univ., Japan)
Pagepp. 577 - 582
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