Wednesday January 25, 2006 |
Title | Electrothermal Analysis and Optimization Techniques for Nanoscale Integrated Circuits |
Author | *Yong Zhan, Brent Goplen, Sachin S. Sapatnekar (Univ. of Minnesota, United States) |
Page | pp. 219 - 222 |
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Title | Electrothermal Engineering in the Nanometer Era: From Devices and Interconnects to Circuits and Systems |
Author | *Kaustav Banerjee, Sheng-Chih Lin, Navin Srivastava (Univ. of California, Santa Barbara, United States) |
Page | pp. 223 - 230 |
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Title | Area Optimization for Leakage Reduction and Thermal Stability in Nanometer Scale Technologies |
Author | *Ja Chun Ku, Yehea Ismail (Northwestern Univ., United States) |
Page | pp. 231 - 236 |
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Title | Compact Thermal Models for Estimation of Temperature-dependent Power/Performance in FinFET Technology |
Author | Aditya Bansal, Mesut Meterelliyoz (Purdue Univ., United States), Siddharth Singh (Osmania Univerisity, India), Jung Hwan Choi, Jayathi Murthy, *Kaushik Roy (Purdue Univ., United States) |
Page | pp. 237 - 242 |
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