IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Date: October 1-3, 2014

Location: Amsterdam, The Netherlands

Website: http://www.dfts.org/

Ashkan Eghbal, Pooria M. Yaghini, Siavash S. Yazdi, Nader Bagherzadeh, “TSV-to-TSV InductiveCoupling-aware Coding Scheme for 3D Network-on-Chip,” IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014):92-97, Amsterdam,The Netherlands, October 1-3, 2014