Temperature Aware VLSI Design for Reduced Power and Reliability Enhancement
by Aseem Gupta, University of California, IrvineMay 29, 2009
by Aseem Gupta, University of California, IrvineMay 29, 2009
by Ashok Halambi, University of California, IrvineJune 3, 2009
by Lochi Yu, University of California, IrvineJune 18, 2009
by Hansu Cho, University of California, IrvineJuly 9, 2009
by Dr. Jongeun LeeEECS, Ulsan National Institute of Science and Technology,Korea
Donald Bren Hall (DBH) 3011 Date & Time
Seminar, July 22, 2009
Dr. Iyad Al Khatib, Solidux Telecom ABStockholm, Sweden Engineering III 2430 July 24, 2009 Abstract
by Dr. Naehyuck ChangSeoul National University
CalIT2 Room 3008
Seminar, August 5, 2009
by Mohammad Ali Ghodrat, University of California, IrvineSeptember 1, 2009
Prof. Lei He, Electrical Engineering Department, UCLAOctober 9. 2009
Dr. Hiroshi Nakamura, University of Tokyo, JapanOctober 19, 2009
Dr. Sung-Soo Lim, Kookmin University, KoreaOctober 22, 2009
Dr. Sani R. NassifIBM Research Labs, Austin, TX Donald Bren Hall 3011 November 10, 2009 Abstract