Mitigating BTI-induced Device Degradation: A Circuit and System Persepctive
Title: Mitigating BTI-induced Device Degradation: A Circuit and System Persepctive Speaker: Professor Ing-Chao Lin, National Cheng Kung University, Taiwan Date and Time: Monday, February 8, 2016 at 1:30 P.M. Location: Donald Bren Hall 3011 Host: Professor Nikil Dutt Abstract: Bias temperature instability which causes a shift in the transistor's threshold voltage and decreases circuit switching […]